Low Dose Rate TID Test of Commercial Bipolar Op Amp

Intern Brandon Norman tests the op amp after taking it out of the radiation chamber of the Keithley 4200 and HP test fixture. Image Credit: URC.

Intern Brandon Norman tests the op amp after taking it out of the radiation chamber of the Keithley 4200 and HP test fixture. Image Credit: URC.

Student: Brandon Norman
Prairie View A&M University, Texas

Major: Electrical Engineering

Degree Level: Bachelor of Science

Internship Site: NASA Goddard Space Flight Center, Greenbelt, Maryland

Mentor: Dr. Jonathan Pellish

Abstract: This project involved Total Ionizing Dose (TID) tests at the GSFC radiation chamber. The tests were performed using a TLE2022 Bipolar Op Amp as the Device Under Test (DUT). The DUT was subject to a Cobalt 60 source at a Low Dose Rate (LDR). The main values observed were the input bias current, supply current, voltage offset, and current offset. The implication from the results support that the device has characteristics of radiation hardened.

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